ElectriMulti75-G Select Quantity:10 per set Maximum specimen height between mount

Maximum specimen height between mount surface and closed lid is 16mm (5/8")

150mm / 6"

The modulus of this sample and its variation over time are only approximately known

Titanium implants are used as solid body implants

ElectriMulti75-G Select Quantity:10 per set Maximum specimen height between mountElectrical, Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample